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Laue 斑点の固有ひろがり

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Title: Laue 斑点の固有ひろがり
Other Titles: A Method of Estimating the Proper Length of a Laue Spot
Authors: 柴田, 昇 / 岩永, 浩
Authors (alternative): Shibata, Noboru / Iwanaga, Hiroshi
Issue Date: 25-Dec-1969
Citation: 長崎大学教養部紀要. 自然科学. 1969, 10, p.21-27
Abstract: To determine precisely the crystal lattice tilting or twist from the radial length of a Laue spot taken by x-ray micro-beam technique, it is necessary to estimate the proper radial length of the corresponding Laue spot when the crystal is completely free from distortion. A method has been developed to estimate the proper length of the Laue spot, employing "effective area" of the specimen for x-ray diffraction. In this method, the specimen is considered to be composed of a set of parallel lattice planes. It is supposed that those planes exist in the effective area can diffract sufficient x-ray beam to blacken the photographic emulsion. An example of the application to an investigation of the Laue spots from a ZnO crystal taken by x-ray micro-beam technique is illustrated.
URI: http://hdl.handle.net/10069/16462
ISSN: 02871319
Type: Departmental Bulletin Paper
Text Version: publisher
Appears in Collections:Volume 10

Citable URI : http://hdl.handle.net/10069/16462

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