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II-VI族化合物結晶の電顕試料作製法


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Title: II-VI族化合物結晶の電顕試料作製法
Other Titles: Procedures of Producing II-VI Compound Specimens for HVEM Observation
Authors: 岩永, 浩 / 柴田, 昇
Authors (alternative): Iwanaga, H. / Shibata, N.
Issue Date: Jul-1984
Citation: 長崎大学教養部紀要. 自然科学篇. 1984, 25(1), p.13-23
Abstract: In order to observe dislocation loops, stacking faults and radiation damages in II-VI compounds such as ZnO, ZnS, CdS, CdSe, CdTe, under a high-voltage electron microscope, thin films of these crystals were prepared by chemical etching, cleavage and ion bonbardment. In addition, as-grown crystals which are thin enough for electron microscopic observations were employed as specimens without any procedures. Characteristics of these procedures and some examples of the observations are described.
URI: http://hdl.handle.net/10069/16564
ISSN: 02871319
Type: Departmental Bulletin Paper
Text Version: publisher
Appears in Collections:Volume 25, No. 1

Citable URI : http://hdl.handle.net/10069/16564

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